Research & Development -
The Metal Power Advantage

Innovation and invention have therefore always been a way of life and a driving force for us. At the core of all our efforts is our unique, one-of-a-kind and fully in-house R&D and Applications Centre. Spread across various functions – Optics, Embedded Systems, Applications, Software development etc. – our team is staffed by scientists, engineers and technologists working at the cutting edge of technology, carrying some of the richest and deepest reservoirs of expertise available in the field of analytical instruments.

We are the first and only company to offer:

OES analyses are only as stable as the plasma and this plasma is generated by the current in the analytical gap. Given the nature of the gap, a voltage-controlled source leads to ripples and instability and therefore reduced precision. Current-controlled sources ensure uniform current at all points in time and therefore far better stability and precision of analyses. Metal Power is the first OES manufacturer in the world to ensure that every model in the portfolio, even at entry-level is equipped with the highest-quality constant-current sources, ensuring the highest level of precision in every class of instrument.

Current-controlled
sources even at
entry-level

Nitrogen is a key element for a large number of ferrous products. From low alloy steels and carbon steels to stainless steels, Nitrogen analysis is a key requirement for most OES users. Historically though, OES makers have restricted this feature only to high-end models and making it optional even there, ensuring N analysis remains out of reach for the large majority of buyers. Keeping in mind our customers’ needs, we have ensured that each and every model comes factory-calibrated for Nitrogen or at least offers the potential for a later on-site upgrade, ensuring that user needs are prioritized and investments are protected.

N analysis on
every model in
the portfolio

Time-resolved spectroscopy (TRS) provides a range of benefits – from lower detection limits to much-improved precision. However, this had long been considered exclusive to PMT OES. Using the latest-generation detectors and the most advanced analytical and software techniques, we have optimized TRS on our fully-CCD OES – and today offer TRS-equipped models for ensuring high precision and also features enabled by TRS such as soluble-insoluble analysis etc.

Time-resolved
spectroscopy on
fully CMOS-based OES

O, N, and H are elements that are extremely difficult to analyse on OES; that said, the value that such analyses add makes some of all of these elements essential for the highest-end manufacturers – specially in Steel, Copper and Titanium applications. With our custom-developed and optimized gratings, cutting-edge detectors and optimized applications, our OES offer O and N analyses down to very low levels on both the Metavision-1008i3 as well as the Metavision-10008X.

Low O (1 ppm),
N (1 ppm)
C,S and P (1 ppm each)

Each customer is unique – and often, customers find that their analytical requirements are not being met by standard off-the-shelf offerings. At Metal Power, through our in-house Applications Lab and R&D team, we ensure that even these requirements are catered to, be it through specific tailored software solutions or tailored Analytical Programs and methods that meet these unique client requirements. From system connectivity to master alloy programs and beyond, we go to great extents to ensure a tailored solution for those with unique requirements

Customized
Applications

Patented Offerings:

Our R&D has developed several new technologies and methodologies that have been patented and are uniquely offered only by Metal Power, globally. Some of these include:

We have developed a patented application method to analyse fine wires, fully quantitatively down to 0.1 mm thickness. This adds a new dimension to the analytical capabilities of OES – and obviates the need for different instruments / complex techniques to conduct such analyses

Fully quantitative fine
wires analysis down
to 0.1 mm diameter

Our patented D-Scan and M-Scan techniques enable us to increase the effective detector – and therefore pixel – count multi-fold. This enhances system resolution a integer multiples while not increasing component count or system complexity, resulting in greater economy as well as far higher stability of the system.

Designed to increase
detector resolution in
integer multiples

Our ‘Hydra’ fibre optics design supports our optical design patents. Through such solutions, we ensure higher resolution, stability and economy, delivering instruments that are best-in-class across all these parameters

Fibre optics design
to enable scanning
solutions

Thin foils down to 50 microns are analysed using routine methods on our OES. For our higher-end models, we have a patented source and method that enables analysis down to even 20 micron thickness

Analysis of thin
foils (20 microns)
on OES

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