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Industry Leading
Methodologies
Methodologies
Our highly qualified team of scientists and engineers specializes in research and application development across metal and oil analysis, driving advancements in spectrometry. Holding multiple patents in optics, applications, and mechanical designs, we constantly innovate to enhance instrument capabilities and add to our portfolio of products and applications.

Oxygen, Nitrogen, and Hydrogen Analysis
Metal Power Analytical was the first OES manufacturer to offer oxygen detection down to 1 ppm. Gaseous elements like oxygen, nitrogen, and hydrogen are challenging to analyse but crucial for high-end applications in Steel, Copper, and Titanium. With custom gratings, cutting-edge detectors, and optimised applications, the Metavision-1008i3 and Metavision-10008X deliver accurate analysis down to single- and sub-ppm detection limits.
Nitrogen Analysis for All Models
Metal Power Analytical was the first OES manufacturer to offer nitrogen analysis using a CMOS detector-based design. Nitrogen is critical in ferrous products, including low-alloy and stainless steels, but it is often limited to high-end OES models. Metal Power ensures every model is factory-calibrated for Nitrogen or offers on-site upgradeability, prioritising user needs and investment protection.
Time-Resolved Spectroscopy (TRS)
TRS enhances detection limits and precision, but was once exclusive to PMT OES. Using advanced detectors and software, Metal Power offers TRS-equipped CMOS OES, enabling high precision and features like soluble-insoluble analysis.
Customised Solutions
Metal Power Analytical, through its in-house Applications Lab and R&D team, caters to unique customer needs with tailored software and analytical methods. From system connectivity to master alloy programs, we provide bespoke solutions for specialised requirements.
Patented Offerings
Metal Power Analytical is the first and only OES manufacturer to offer fine wire analysis down to 0.1 mm diameter and ultra-thin foil analysis down to 0.02 mm thickness on an Optical Emission Spectrometer.